000 00402nam a22001577a 4500
005 20240521131153.0
008 240521b |||||||| |||| 00| 0 eng d
020 _a9780124343306
040 _cMVJCE
082 _a621.39 LAK;0
100 _aLala K.Parag
_9837
245 _aDigital Circuit Testing and Testability
260 _aUSA
_bAcademic Press
_c1997
300 _axii+199p
942 _2ddc
_cENGBK
999 _c41844
_d41844