Digital Systems Testing and Testable Design
Material type:
TextPublication details: New Yark Wiley Interscience 1990Description: xvii+652ISBN: 9780780310629DDC classification: 621.381 ABR;0
| Item type | Current library | Collection | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| Engineering Book | MVJCE CENTRAL LIBRARY | M.Tech ECE | 621.381 ABR;0 (Browse shelf (Opens below)) | Available | 52102 | |
| Engineering Book | MVJCE CENTRAL LIBRARY | M.Tech ECE | 621.381 ABR;1 (Browse shelf (Opens below)) | Available | 52103 |
Browsing MVJCE CENTRAL LIBRARY shelves, Collection: M.Tech ECE Close shelf browser (Hides shelf browser)
| 371.26 VER;0 Quantitative Aptitude: Quantum CAT | 371.26 VER;01 Quantitative Aptitude: Quantum CAT | 371.26 VER;02 Quantitative Aptitude: Quantum CAT | 621.381 ABR;0 Digital Systems Testing and Testable Design | 621.381 ABR;1 Digital Systems Testing and Testable Design | 621.382 HAY;0 Statistical Digital Signal Processing and Modeling | 621.382 HAY;0 Statistical Digital Signal Processing and Modeling |
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